The NYS Dry Bean Meeting will be paired with the annual Dry Bean Cutting Event again this year! The morning meeting will include market updates and presentations on the latest dry bean research in New York: dry bean variety breeding and trial updates, white mold control, Western bean cutworm management, and identifying management tactics for major pests in dry beans. 2.0 DEC and CCA credits will be available.

This meeting is sponsored by New York Bean and Genesee Valley Bean Company. We appreciate their support!

The Dry Bean Cutting will follow the meeting and showcase the canned dry beans from the 2024 Dry Bean Variety Trial. 

AGENDA:

9:00 AM  Welcome/Announcements/DEC Sign-in

9:05  Overview of the 2024 growing season and market update -- Matt Stawowy, Steele & Co

9:35  Breeding, evaluation and development of dry bean varieties that are highly adapted to NYS growing environments and markets -- Phillip Griffiths, Cornell

10:05  Comparison of new and standard dry bean varieties at NYSAES research farm: 2024 NYS Dry Bean Variety Trial updates -- Steve Reiners and Michael Rosato, Cornell

10:15  Break

10:30  Fungicide-based white mold control in dry bean in New York -- Sarah Pethybridge, Cornell

11:00  Determine the magnitude and distribution of Western bean cutworm, and the risk to dry beans, in the major production area in New York -- Margie Lund, CCE Cornell Vegetable Program, and Marion Zuefle, NYS IPM Program

11:30  Identifying effective management tactics for major pests in dry bean -- Brian Nault and Leo Salgado, Cornell

12:00 PM Adjourn Meeting; pick up DEC credit sheets

12:00-1:00 Lunch (included for all attendees)

1:00 PM Dry Bean Cutting held in Raw Products Building (7 Crabapple Dr). All are welcome to attend!


COST and REGISTRATION: $10. Pre-register online by March 16th. At the door registrations will be accepted but lunch cannot be guaranteed.

SPONSORSHIPS: Sponsorship opportunities are available. Contact Margie Lund for details.

Other questions about this event? Reach out to Margie Lund.